Our websites may use cookies to personalize and enhance your experience. By continuing without changing your cookie settings, you agree to this collection. For more information, please see our University Websites Privacy Notice.

HueyAFM Labs

AFM Methods

General Information

Atomic Force Microscopy Overview

Novice Techniques (20+ Hours of Experience To Work Independently)

Surface Topography

Surface Roughness

Phase Mapping

Intermediate Techniques (50+ Hours of Experience To Work Independently)

Friction Force Microscopy

Force Mapping

Adhesion Mapping

Expert Techniques (Collaborate with our Lab Members)

Tomographic AFM

Conductive Force Microscopy

Photoconductive Atomic Force Microscopy and Spectroscopy

I-V Spectroscopy

Circuit Current Open Circuit Potential

High Speed Scanning Probe Microscopy

Piezoresponse Force Microscopy

Simultaenous Normal and Lateral Vibration Detection

Ferroelectric Domain Dynamics

Nanosecond Scale Tip Pulsing

Surface Potential Mapping

Magnetic Force Microscopy

Error Corrected AFM

Ultrasonic Force Microscopy

Atomic Force Acoustic Microscopy

MEMS Monitoring

Surface Dynamics

AFM on Living Cells

Nanofabrication Polishing

Cross-Sectional Imaging

Scanning Thermal Microscopy

Custom AFM Probes

Scanning Electron Microscopy

Focused Ion Beam

Acoustics and Optics

Micro Acoustic Traps